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Bruker Nano's X-ray systems and components for elemental and structural analysis on the micro- and nanoscale include analytical tools for electron microscopes as well as mobile benchtop Micro-XRF and TXRF spectrometers. The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the non-destructive analysis of bulk materials and coatings. Designed for fast and costefficient operation it provides accurate information on the elemental composition of materials.